CENG 213. Nanoscale Characterization (4 units)
Link to catalog page: https://catalog.ucsd.edu/courses/NANO.html#ceng213
Description
Examination of nanoscale characterization approaches including imaging, scattering, and spectroscopic techniques and their physical operating mechanisms. Microscopy (optical and electron: SEM, TEM); scattering and diffraction; spectroscopies (EDX, SIMS, mass spec, Raman, XPS, XAS); scanning probe microscopes (SPM, AFM); particle size analysis. Cross-listed with NANO 203. Students may not receive credit for both CENG 213 and NANO 203. Prerequisites: graduate standing.
Prerequisite courses
CENG 213 has no prerequisite courses.
Successor courses
No courses have CENG 213 as a prerequisite.