NANO 238. Scanning Probe Microscopy (4 units)
Link to catalog page: https://catalog.ucsd.edu/courses/NANO.html#nano238
Description
Scanning electron microscopy (SEM) detectors, imaging, image interpretation, and artifacts, introduction to lenses, electron beam-specimen interactions. Operating principles and capabilities for atomic force microscopy and scanning tunneling microscopy, scanning optical microscopy and scanning transmission electron microscopy. Prerequisites: consent of instructor.
Prerequisite courses
NANO 238 has no prerequisite courses.
Successor courses
No courses have NANO 238 as a prerequisite.